Jin Zha, Xiaole Cui, Chung-Len Lee
Modeling and testing of interference faults in the nano NAND Flash memory
DATE, 2012.
@inproceedings{DATE-2012-ZhaCL,
acmid = "2492839",
author = "Jin Zha and Xiaole Cui and Chung-Len Lee",
booktitle = "{Proceedings of the 16th Conference and Exhibition on Design, Automation and Test in Europe}",
isbn = "978-1-4577-2145-8",
pages = "527--531",
publisher = "{IEEE}",
title = "{Modeling and testing of interference faults in the nano NAND Flash memory}",
year = 2012,
}