Travelled to:
1 × Germany
Collaborated with:
X.Cui C.Lee
Talks about:
interfer (1) memori (1) model (1) flash (1) fault (1) test (1) nano (1) nand (1)
Person: Jin Zha
DBLP: Zha:Jin
Contributed to:
Wrote 1 papers:
- DATE-2012-ZhaCL #fault #memory management #modelling #testing
- Modeling and testing of interference faults in the nano NAND Flash memory (JZ, XC, CLL), pp. 527–531.