Travelled to:1 × Germany
Collaborated with:J.Zha C.Lee
Talks about:interfer (1) memori (1) model (1) flash (1) fault (1) test (1) nano (1) nand (1)
Person: Xiaole Cui
DBLP: Cui:Xiaole
Contributed to:
Wrote 1 papers:
- DATE-2012-ZhaCL #fault #memory management #modelling #testing
- Modeling and testing of interference faults in the nano NAND Flash memory (JZ, XC, CLL), pp. 527–531.












