Travelled to:2 × USA
Collaborated with:R.Karri R.Levy D.Blaauw G.Braca A.Grinshpon C.Oh B.Orshav S.Sirichotiyakul V.Zolotov
Talks about:reliabl (2) enhanc (2) electromigr (1) transistor (1) submicron (1) distribut (1) reorder (1) carrier (1) analysi (1) design (1)
Person: Aurobindo Dasgupta
DBLP: Dasgupta:Aurobindo
Contributed to:
20001996Wrote 3 papers:
- DAC-2000-LevyBBDGOOSZ #analysis #design #named
- ClariNet: a noise analysis tool for deep submicron design (RL, DB, GB, AD, AG, CO, BO, SS, VZ), pp. 233–238.
- DAC-1996-DasguptaK #process #reliability
- Electromigration Reliability Enhancement via Bus Activity Distribution (AD, RK), pp. 353–356.
- DAC-1996-DasguptaK96a #order #reliability
- Hot-Carrier Reliability Enhancement via Input Reordering and Transistor Sizing (AD, RK), pp. 819–824.