Travelled to:2 × Germany
Collaborated with:S.Khan I.Agbo S.Hamdioui H.Kukner P.Raghavan F.Catthoor G.G.E.Gielen P.H.N.D.Wit E.Maricau J.Loeckx J.Martín-Martínez G.Groeseneken R.Rodríguez M.Nafría
Talks about:temperatur (1) technolog (1) challeng (1) reliabl (1) nanomet (1) instabl (1) analysi (1) yield (1) emerg (1) sram (1)
Person: Ben Kaczer
DBLP: Kaczer:Ben
Contributed to:
20142008Wrote 2 papers:
- DATE-2014-KhanAHKKRC #analysis #bias
- Bias Temperature Instability analysis of FinFET based SRAM cells (SK, IA, SH, HK, BK, PR, FC), pp. 1–6.
- DATE-2008-GielenWMLMKGRN #challenge #reliability
- Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies (GGEG, PHNDW, EM, JL, JMM, BK, GG, RR, MN), pp. 1322–1327.