Travelled to:1 × France
2 × Germany
4 × USA
Collaborated with:S.Sinha X.Zeng D.Zhou Y.Yu I.H.Jiang L.Feng G.Lin J.Guo F.Yang Y.Chan K.Hsu Y.Pi T.Ho J.Luo Q.Su J.Kawa A.B.Kahng X.Xu A.Zelikovsky Q.Fang Y.Su W.Cai X.Zhou J.Liu R.Li
Talks about:hotspot (3) detect (3) use (3) nonlinear (2) extract (2) classif (2) analysi (2) variat (2) reduct (2) method (2)
Person: Charles Chiang
DBLP: Chiang:Charles
Contributed to:
2013201220112006
200620052004Wrote 9 papers:
- DAC-2013-YuLJC #classification #detection #feature model #using
- Machine-learning-based hotspot detection using topological classification and critical feature extraction (YTY, GHL, IHRJ, CC), p. 6.
- DAC-2012-GuoYSCZ #classification #distance #metric
- Improved tangent space based distance metric for accurate lithographic hotspot classification (JG, FY, SS, CC, XZ), pp. 1173–1178.
- DAC-2012-YuCSJC #design #detection #using
- Accurate process-hotspot detection using critical design rule extraction (YTY, YCC, SS, IHRJ, CC), pp. 1167–1172.
- DAC-2011-HsuSPCH #algorithm #distributed #geometry #layout
- A distributed algorithm for layout geometry operations (KTH, SS, YCP, CC, TYH), pp. 182–187.
- DAC-2006-LuoSSKC
- An IC manufacturing yield model considering intra-die variations (JL, SS, QS, JK, CC), pp. 749–754.
- DATE-2006-ZengFSCZC #domain model #order #reduction
- Time domain model order reduction by wavelet collocation method (XZ, LF, YS, WC, DZ, CC), pp. 21–26.
- DATE-2005-ChiangKSXZ #detection
- Bright-Field AAPSM Conflict Detection and Correction (CC, ABK, SS, XX, AZ), pp. 908–913.
- DATE-v2-2004-FengZCZF #analysis #order #reduction
- Direct Nonlinear Order Reduction with Variational Analysis (LF, XZ, CC, DZ, QF), pp. 1316–1321.
- DATE-v2-2004-ZhouZLLZC #analysis #using
- Steady-State Analysis of Nonlinear Circuits Using Discrete Singular Convolution Method (XZ, DZ, JL, RL, XZ, CC), pp. 1322–1326.