Travelled to:1 × France
1 × Germany
3 × USA
Collaborated with:C.Chiang J.Guo F.Yang X.Zeng Y.Yu Y.Chan I.H.Jiang K.Hsu Y.Pi T.Ho Y.Yang A.G.Veneris R.K.Brayton D.E.Smith J.Luo Q.Su J.Kawa A.B.Kahng X.Xu A.Zelikovsky
Talks about:hotspot (2) detect (2) accur (2) manufactur (1) lithograph (1) distribut (1) algorithm (1) sequenti (1) geometri (1) conflict (1)
Person: Subarna Sinha
DBLP: Sinha:Subarna
Contributed to:
20122011
200920062005Wrote 6 papers:
- DAC-2012-GuoYSCZ #classification #distance #metric
- Improved tangent space based distance metric for accurate lithographic hotspot classification (JG, FY, SS, CC, XZ), pp. 1173–1178.
- DAC-2012-YuCSJC #design #detection #using
- Accurate process-hotspot detection using critical design rule extraction (YTY, YCC, SS, IHRJ, CC), pp. 1167–1172.
- DAC-2011-HsuSPCH #algorithm #distributed #geometry #layout
- A distributed algorithm for layout geometry operations (KTH, SS, YCP, CC, TYH), pp. 182–187.
- DATE-2009-YangSVBS #approximate #logic
- Sequential logic rectifications with approximate SPFDs (YSY, SS, AGV, RKB, DES), pp. 1698–1703.
- DAC-2006-LuoSSKC
- An IC manufacturing yield model considering intra-die variations (JL, SS, QS, JK, CC), pp. 749–754.
- DATE-2005-ChiangKSXZ #detection
- Bright-Field AAPSM Conflict Detection and Correction (CC, ABK, SS, XX, AZ), pp. 908–913.