Travelled to:2 × USA
Collaborated with:S.Gu J.Sun Y.Wu S.Venkataraman W.K.Fuchs J.H.Patel
Talks about:scan (4) test (3) cost (2) architectur (1) partial (1) circuit (1) inform (1) effect (1) design (1) applic (1)
Person: Dong Xiang
DBLP: Xiang:Dong
Contributed to:
20031996Wrote 2 papers:
- DAC-2003-XiangGSW #architecture #effectiveness #testing
- A cost-effective scan architecture for scan testing with non-scan test power and test application cost (DX, SG, JGS, YLW), pp. 744–747.
- DAC-1996-XiangVFP #design
- Partial Scan Design Based on Circuit State Information (DX, SV, WKF, JHP), pp. 807–812.