Travelled to:1 × France
1 × Germany
3 × USA
Collaborated with:W.K.Fuchs J.H.Patel Y.Yang A.G.Veneris P.J.Thadikaran I.Pomeranz S.M.Reddy B.Seshadri D.Xiang I.Hartanto E.M.Rudnick S.Chakravarty R.Puri S.Griffith A.Oberai R.Madge G.Yeric W.Ng Y.Zorian
Talks about:circuit (3) fault (3) design (2) model (2) characterist (1) manufactur (1) simplifi (1) sequenti (1) diagnost (1) diagnosi (1)
Person: Srikanth Venkataraman
DBLP: Venkataraman:Srikanth
Contributed to:
2007
2005200419961995Wrote 5 papers:
- DAC-2007-VenkataramanPGOMYNZ
- Making Manufacturing Work For You (SV, RP, SG, AO, RM, GY, WN, YZ), pp. 107–108.
- DATE-2005-YangVTV #automation #debugging #design #fault #modelling #power management
- Extraction Error Modeling and Automated Model Debugging in High-Performance Low Power Custom Designs (YSY, AGV, PJT, SV), pp. 996–1001.
- DATE-v1-2004-PomeranzVRS #detection #fault
- Z-Sets and Z-Detections: Circuit Characteristics that Simplify Fault Diagnosis (IP, SV, SMR, BS), pp. 68–75.
- DAC-1996-XiangVFP #design
- Partial Scan Design Based on Circuit State Information (DX, SV, WKF, JHP), pp. 807–812.
- DAC-1995-VenkataramanHFRCP #agile #fault #simulation #using
- Rapid Diagnostic Fault Simulation of Stuck-at Faults in Sequential Circuits Using Compact Lists (SV, IH, WKF, EMR, SC, JHP), pp. 133–138.