Travelled to:1 × Germany
Collaborated with:D.J.Lilja
Talks about:statist (1) circuit (1) method (1) design (1) toler (1) level (1) fault (1) guid (1)
Person: Drew C. Ness
DBLP: Ness:Drew_C=
Contributed to:
2008Wrote 1 papers:
- DATE-2008-NessL #design #fault tolerance #statistics
- Guiding Circuit Level Fault-Tolerance Design with Statistical Methods (DCN, DJL), pp. 348–353.