Travelled to:1 × Germany
Collaborated with:A.Riefert M.Sauer P.Bernardi M.S.Reorda B.Becker
Talks about:processor (1) function (1) approach (1) generat (1) automat (1) effect (1) small (1) fault (1) delay (1) test (1)
Person: Lyl M. Ciganda
DBLP: Ciganda:Lyl_M=
Contributed to:
2014Wrote 1 papers:
- DATE-2014-RiefertCSBRB #approach #automation #effectiveness #fault #functional #generative #testing
- An effective approach to automatic functional processor test generation for small-delay faults (AR, LMC, MS, PB, MSR, BB), pp. 1–6.