Travelled to:
2 × USA
Collaborated with:
X.Chou P.Piwowarski J.M.Caruso
Talks about:
imperfect (1) function (1) softwar (1) reliabl (1) coverag (1) measur (1) growth (1) experi (1) affect (1) debug (1)
Person: Mitsuru Ohba
DBLP: Ohba:Mitsuru
Contributed to:
Wrote 2 papers:
- ICSE-1993-PiwowarskiOC #experience #metric #testing
- Coverage Measurement Experience During Function Test (PP, MO, JMC), pp. 287–301.
- ICSE-1989-OhbaC #debugging #question #reliability
- Does Imperfect Debugging Affect Software Reliability Growth? (MO, XMC), pp. 237–244.