Travelled to:2 × USA
Collaborated with:G.Steele D.Overhauser S.Z.Hussain V.Veetil D.Sylvester D.Blaauw S.Shah
Talks about:full (2) chip (2) distribut (1) analysi (1) variat (1) system (1) method (1) leakag (1) effici (1) depend (1)
Person: Steffen Rochel
DBLP: Rochel:Steffen
Contributed to:
20091998Wrote 2 papers:
- DAC-2009-VeetilSBSR #analysis #dependence #performance
- Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence (VV, DS, DB, SS, SR), pp. 154–159.
- DAC-1998-SteeleORH #verification
- Full-Chip Verification Methods for DSM Power Distribution Systems (GS, DO, SR, SZH), pp. 744–749.