Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence
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Vineeth Veetil, Dennis Sylvester, David Blaauw, Saumil Shah, Steffen Rochel
Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence
DAC, 2009.

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@inproceedings{DAC-2009-VeetilSBSR,
	author        = "Vineeth Veetil and Dennis Sylvester and David Blaauw and Saumil Shah and Steffen Rochel",
	booktitle     = "{Proceedings of the 46th Design Automation Conference}",
	doi           = "10.1145/1629911.1629956",
	isbn          = "978-1-60558-497-3",
	pages         = "154--159",
	publisher     = "{ACM}",
	title         = "{Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence}",
	year          = 2009,
}

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