Vineeth Veetil, Dennis Sylvester, David Blaauw, Saumil Shah, Steffen Rochel
Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence
DAC, 2009.
@inproceedings{DAC-2009-VeetilSBSR,
author = "Vineeth Veetil and Dennis Sylvester and David Blaauw and Saumil Shah and Steffen Rochel",
booktitle = "{Proceedings of the 46th Design Automation Conference}",
doi = "10.1145/1629911.1629956",
isbn = "978-1-60558-497-3",
pages = "154--159",
publisher = "{ACM}",
title = "{Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence}",
year = 2009,
}