Travelled to:
1 × France
1 × USA
Collaborated with:
R.Kapur P.Bhattacharya S.Chattopadhyay I.Sengupta
Talks about:
diagnosi (2) compressor (1) techniqu (1) extrem (1) design (1) assist (1) volum (1) fault (1) chain (1) test (1)
Person: Subhadip Kundu
DBLP: Kundu:Subhadip
Contributed to:
Wrote 2 papers:
- DATE-2015-KunduBK #design #fault #testing
- Fault diagnosis in designs with extreme low pin test data compressors (SK, PB, RK), pp. 1285–1288.
- DAC-2013-KunduCSK
- An ATE assisted DFD technique for volume diagnosis of scan chains (SK, SC, IS, RK), p. 6.