Subhadip Kundu, Parthajit Bhattacharya, Rohit Kapur
Fault diagnosis in designs with extreme low pin test data compressors
DATE, 2015.
@inproceedings{DATE-2015-KunduBK,
acmid = "2757111",
author = "Subhadip Kundu and Parthajit Bhattacharya and Rohit Kapur",
booktitle = "{Proceedings of the 19th Conference and Exhibition on Design, Automation and Test in Europe}",
isbn = "978-3-9815370-4-8",
pages = "1285--1288",
publisher = "{ACM}",
title = "{Fault diagnosis in designs with extreme low pin test data compressors}",
year = 2015,
}