Travelled to:
1 × France
Collaborated with:
S.Kundu R.Kapur
Talks about:
compressor (1) diagnosi (1) extrem (1) design (1) fault (1) test (1) data (1) pin (1) low (1)
Person: Parthajit Bhattacharya
DBLP: Bhattacharya:Parthajit
Contributed to:
Wrote 1 papers:
- DATE-2015-KunduBK #design #fault #testing
- Fault diagnosis in designs with extreme low pin test data compressors (SK, PB, RK), pp. 1285–1288.