Travelled to:1 × France
2 × USA
Collaborated with:L.Wang K.Cheng C.Metra M.Omaña M.S.Abadir A.Krstic J.Liou
Talks about:diagnosi (2) statist (2) fault (2) delay (2) base (2) testabl (1) resolut (1) featur (1) enhanc (1) design (1)
Person: T. M. Mak
DBLP: Mak:T=_M=
Contributed to:
2004
20042003Wrote 3 papers:
- DAC-2004-WangMCA #learning #on the
- On path-based learning and its applications in delay test and diagnosis (LCW, TMM, KTC, MSA), pp. 492–497.
- DATE-v1-2004-MetraMO #design #fault #question #testing
- Are Our Design for Testability Features Fault Secure? (CM, TMM, MO), pp. 714–715.
- DAC-2003-KrsticWCLM #fault #modelling #statistics
- Enhancing diagnosis resolution for delay defects based upon statistical timing and statistical fault models (AK, LCW, KTC, JJL, TMM), pp. 668–673.