Travelled to:1 × France
2 × USA
Collaborated with:Y.Cao R.Vattikonda Y.Wang X.Chen Y.Xie H.Yang S.Yang S.Bhardwaj S.B.K.Vrudhula F.Liu
Talks about:nbti (2) techniqu (1) simultan (1) sequenti (1) perform (1) nanomet (1) circuit (1) robust (1) replac (1) leakag (1)
Person: Wenping Wang
DBLP: Wang:Wenping
Contributed to:
2009
20072006Wrote 3 papers:
- DATE-2009-0002CWCXY #optimisation
- Gate replacement techniques for simultaneous leakage and aging optimization (YW, XC, WW, YC, YX, HY), pp. 328–333.
- DAC-2007-WangYBVVLC #performance
- The Impact of NBTI on the Performance of Combinational and Sequential Circuits (WW, SY, SB, RV, SBKV, FL, YC), pp. 364–369.
- DAC-2006-VattikondaWC #design #modelling #robust
- Modeling and minimization of PMOS NBTI effect for robust nanometer design (RV, WW, YC), pp. 1047–1052.