Göran Jerke, Jens Lienig
Hierarchical Current Density Verification for Electromigration Analysis in Arbitrary Shaped Metallization Patterns of Analog Circuits
DATE, 2002.
@inproceedings{DATE-2002-JerkeL,
acmid = "874436",
author = "Göran Jerke and Jens Lienig",
booktitle = "{Proceedings of the Seventh Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2002.998314",
isbn = "0-7695-1471-5",
pages = "464--469",
publisher = "{IEEE Computer Society}",
title = "{Hierarchical Current Density Verification for Electromigration Analysis in Arbitrary Shaped Metallization Patterns of Analog Circuits}",
year = 2002,
}











