Lindsay V. Allen, Dawn M. Tilbury
Event-based fault detection of manufacturing cell: Data inconsistencies between academic assumptions and industry practice
CASE, 2010.
@inproceedings{CASE-2010-AllenT,
author = "Lindsay V. Allen and Dawn M. Tilbury",
booktitle = "{Proceedings of the Sixth International Conference on Automation Science and Engineering}",
doi = "10.1109/COASE.2010.5584595",
isbn = "978-1-4244-5447-1",
pages = "426--432",
publisher = "{IEEE}",
title = "{Event-based fault detection of manufacturing cell: Data inconsistencies between academic assumptions and industry practice}",
year = 2010,
}











