Changhai Ru, Yong Zhang, Yu Sun, Yu Zhong, Xueliang Sun, David Hoyle, Ian Cotton
Automated four-point probe measurement of nanowires inside a scanning electron microscope
CASE, 2010.
@inproceedings{CASE-2010-RuZSZSHC, author = "Changhai Ru and Yong Zhang and Yu Sun and Yu Zhong and Xueliang Sun and David Hoyle and Ian Cotton", booktitle = "{Proceedings of the Sixth International Conference on Automation Science and Engineering}", doi = "10.1109/COASE.2010.5584461", isbn = "978-1-4244-5447-1", pages = "533--538", publisher = "{IEEE}", title = "{Automated four-point probe measurement of nanowires inside a scanning electron microscope}", year = 2010, }