Changhai Ru, Yong Zhang, Yu Sun, Yu Zhong, Xueliang Sun, David Hoyle, Ian Cotton
Automated four-point probe measurement of nanowires inside a scanning electron microscope
CASE, 2010.
@inproceedings{CASE-2010-RuZSZSHC,
author = "Changhai Ru and Yong Zhang and Yu Sun and Yu Zhong and Xueliang Sun and David Hoyle and Ian Cotton",
booktitle = "{Proceedings of the Sixth International Conference on Automation Science and Engineering}",
doi = "10.1109/COASE.2010.5584461",
isbn = "978-1-4244-5447-1",
pages = "533--538",
publisher = "{IEEE}",
title = "{Automated four-point probe measurement of nanowires inside a scanning electron microscope}",
year = 2010,
}











