Automated four-point probe measurement of nanowires inside a scanning electron microscope
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Changhai Ru, Yong Zhang, Yu Sun, Yu Zhong, Xueliang Sun, David Hoyle, Ian Cotton
Automated four-point probe measurement of nanowires inside a scanning electron microscope
CASE, 2010.

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@inproceedings{CASE-2010-RuZSZSHC,
	author        = "Changhai Ru and Yong Zhang and Yu Sun and Yu Zhong and Xueliang Sun and David Hoyle and Ian Cotton",
	booktitle     = "{Proceedings of the Sixth International Conference on Automation Science and Engineering}",
	doi           = "10.1109/COASE.2010.5584461",
	isbn          = "978-1-4244-5447-1",
	pages         = "533--538",
	publisher     = "{IEEE}",
	title         = "{Automated four-point probe measurement of nanowires inside a scanning electron microscope}",
	year          = 2010,
}

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