Travelled to:
1 × Canada
Collaborated with:
C.Ru Y.Zhang Y.Sun Y.Zhong D.Hoyle I.Cotton
Talks about:
microscop (1) electron (1) nanowir (1) measur (1) probe (1) point (1) insid (1) autom (1) scan (1) four (1)
Person: Xueliang Sun
DBLP: Sun:Xueliang
Contributed to:
Wrote 1 papers:
- CASE-2010-RuZSZSHC #automation #metric
- Automated four-point probe measurement of nanowires inside a scanning electron microscope (CR, YZ, YS, YZ, XS, DH, IC), pp. 533–538.