Akihiko Yamada, Nobuo Wakatsuki, Hideo Shibano, Osamu Itoh, Kyoji Tomita, Shigehiro Funatsu
Automatic test generation for large digital circuits
DAC, 1977.
@inproceedings{DAC-1977-YamadaWSITF,
acmid = "809108",
author = "Akihiko Yamada and Nobuo Wakatsuki and Hideo Shibano and Osamu Itoh and Kyoji Tomita and Shigehiro Funatsu",
booktitle = "{Proceedings of the 14th Design Automation Conference}",
pages = "78--83",
publisher = "{ACM}",
title = "{Automatic test generation for large digital circuits}",
year = 1977,
}