Travelled to:
1 × USA
Collaborated with:
A.Yamada N.Wakatsuki O.Itoh K.Tomita S.Funatsu
Talks about:
generat (1) circuit (1) automat (1) digit (1) test (1) larg (1)
Person: Hideo Shibano
DBLP: Shibano:Hideo
Contributed to:
Wrote 1 papers:
- DAC-1977-YamadaWSITF #automation #generative #scalability #testing
- Automatic test generation for large digital circuits (AY, NW, HS, OI, KT, SF), pp. 78–83.