@inproceedings{DAC-1981-El-Ziq,
	acmid         = "802328",
	author        = "Yacoub M. El-Ziq",
	booktitle     = "{Proceedings of the 18th Design Automation Conference}",
	pages         = "347--354",
	publisher     = "{ACM/IEEE}",
	title         = "{Automatic test generation for stuck-open faults in CMOS VLSI}",
	year          = 1981,
}