An automated system for testing LSI memory chips
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H. D. Schnurmann, L. J. Vidunas, R. M. Peters
An automated system for testing LSI memory chips
DAC, 1984.

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@inproceedings{DAC-1984-SchnurmannVP,
	acmid         = "800838",
	author        = "H. D. Schnurmann and L. J. Vidunas and R. M. Peters",
	booktitle     = "{Proceedings of the 21st Design Automation Conference}",
	isbn          = "0-8186-0542-1",
	pages         = "454--458",
	publisher     = "{ACM/IEEE}",
	title         = "{An automated system for testing LSI memory chips}",
	year          = 1984,
}

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