Travelled to:2 × USA
Collaborated with:R.M.Peters L.J.Vidunas
Talks about:test (3) system (2) lsi (2) interact (1) product (1) memori (1) autom (1) data (1) chip (1)
Person: H. D. Schnurmann
DBLP: Schnurmann:H=_D=
Contributed to:
19841980Wrote 2 papers:
- DAC-1984-SchnurmannVP #automation #memory management #testing
- An automated system for testing LSI memory chips (HDS, LJV, RMP), pp. 454–458.
- DAC-1980-SchnurmannP #interactive #testing
- An interactive test data system for LSI production testing (HDS, RMP), pp. 362–366.