Andrzej Krasniewski, Alexander Albicki
Simulation-free estimation of speed degradation in NMOS self-testing circuits for CAD applications
DAC, 1985.
@inproceedings{DAC-1985-KrasniewskiA, author = "Andrzej Krasniewski and Alexander Albicki", booktitle = "{Proceedings of the 22nd Design Automation Conference}", doi = "10.1145/317825.318001", isbn = "0-8186-0635-5", pages = "808--811", publisher = "{ACM}", title = "{Simulation-free estimation of speed degradation in NMOS self-testing circuits for CAD applications}", year = 1985, }