Travelled to:
1 × USA
Collaborated with:
A.Krasniewski
Talks about:
circuit (1) degrad (1) applic (1) speed (1) simul (1) estim (1) test (1) self (1) nmos (1) free (1)
Person: Alexander Albicki
DBLP: Albicki:Alexander
Contributed to:
Wrote 1 papers:
- DAC-1985-KrasniewskiA #estimation #self
- Simulation-free estimation of speed degradation in NMOS self-testing circuits for CAD applications (AK, AA), pp. 808–811.