Pattern-Independent Current Estimation for Reliability Analysis of CMOS Circuits
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Richard Burch, Farid N. Najm, Ping Yang, Dale E. Hocevar
Pattern-Independent Current Estimation for Reliability Analysis of CMOS Circuits
DAC, 1988.

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@inproceedings{DAC-1988-BurchNYH,
	acmid         = "285730.285778",
	author        = "Richard Burch and Farid N. Najm and Ping Yang and Dale E. Hocevar",
	booktitle     = "{Proceedings of the 25th Design Automation Conference}",
	pages         = "294--299",
	publisher     = "{ACM}",
	title         = "{Pattern-Independent Current Estimation for Reliability Analysis of CMOS Circuits}",
	year          = 1988,
}

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