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Travelled to:
1 × USA
Collaborated with:
F.N.Najm P.Yang D.E.Hocevar
Talks about:
independ (1) reliabl (1) pattern (1) current (1) circuit (1) analysi (1) estim (1) cmos (1)

Person: Richard Burch

DBLP DBLP: Burch:Richard

Contributed to:

DAC 19881988

Wrote 1 papers:

DAC-1988-BurchNYH #analysis #estimation #independence #reliability
Pattern-Independent Current Estimation for Reliability Analysis of CMOS Circuits (RB, FNN, PY, DEH), pp. 294–299.
Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
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