Travelled to:1 × USA
Collaborated with:R.Burch F.N.Najm P.Yang
Talks about:independ (1) reliabl (1) pattern (1) current (1) circuit (1) analysi (1) estim (1) cmos (1)
Person: Dale E. Hocevar
DBLP: Hocevar:Dale_E=
Contributed to:
1988Wrote 1 papers:
- DAC-1988-BurchNYH #analysis #estimation #independence #reliability
- Pattern-Independent Current Estimation for Reliability Analysis of CMOS Circuits (RB, FNN, PY, DEH), pp. 294–299.