Correlation-Reduced Scan-path Design To Improve Delay Fault Coverage
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Weiwei Mao, Michael D. Ciletti
Correlation-Reduced Scan-path Design To Improve Delay Fault Coverage
DAC, 1991.

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@inproceedings{DAC-1991-MaoC,
	author        = "Weiwei Mao and Michael D. Ciletti",
	booktitle     = "{Proceedings of the 28th Design Automation Conference}",
	doi           = "10.1145/127601.127631",
	isbn          = "0-89791395-7",
	pages         = "73--79",
	publisher     = "{ACM}",
	title         = "{Correlation-Reduced Scan-path Design To Improve Delay Fault Coverage}",
	year          = 1991,
}

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