Travelled to:
4 × USA
Collaborated with:
M.D.Ciletti X.Ling
Talks about:
fault (4) test (4) delay (3) algorithm (2) generat (2) method (2) waveform (1) simplifi (1) variabl (1) testabl (1)
Person: Weiwei Mao
DBLP: Mao:Weiwei
Contributed to:
Wrote 5 papers:
- DAC-1991-MaoC #design #fault
- Correlation-Reduced Scan-path Design To Improve Delay Fault Coverage (WM, MDC), pp. 73–79.
- DAC-1990-MaoC #fault #testing
- A Variable Observation Time Method for Testing Delay Faults (WM, MDC), pp. 728–731.
- DAC-1989-MaoC #fault #testing
- A Simplified Six-waveform Type Method for Delay Fault Testing (WM, MDC), pp. 730–733.
- DAC-1988-MaoC #algorithm #generative #metric #named #self #testing #using
- Dytest: A Self-Learning Algorithm Using Dynamic Testability Measures to Accelerate Test Generation (WM, MDC), pp. 591–596.
- DAC-1986-WeiweiX #algorithm #fault #generative #robust #testing
- Robust test generation algorithm for stuck-open fault in CMOS circuits (WM, XL), pp. 236–242.