Ismet Bayraktaroglu, Alex Orailoglu
Test Volume and Application Time Reduction Through Scan Chain Concealment
DAC, 2001.
@inproceedings{DAC-2001-BayraktarogluO,
author = "Ismet Bayraktaroglu and Alex Orailoglu",
booktitle = "{Proceedings of the 38th Design Automation Conference}",
doi = "10.1145/378239.378388",
isbn = "1-58113-297-2",
pages = "151--155",
publisher = "{ACM}",
title = "{Test Volume and Application Time Reduction Through Scan Chain Concealment}",
year = 2001,
}











