@inproceedings{DAC-2001-PomeranzR,
	author        = "Irith Pomeranz and Sudhakar M. Reddy",
	booktitle     = "{Proceedings of the 38th Design Automation Conference}",
	doi           = "10.1145/378239.378390",
	isbn          = "1-58113-297-2",
	pages         = "156--161",
	publisher     = "{ACM}",
	title         = "{An Approach to Test Compaction for Scan Circuits that Enhances At-Speed Testing}",
	year          = 2001,
}