Kaamran Raahemifar, Majid Ahmadi
Fault Characterizations and Design-for-Testability Technique for Detecting IDDQ Faults in CMOS/BiCMOS Circuits
DAC, 2001.
@inproceedings{DAC-2001-RaahemifarA,
author = "Kaamran Raahemifar and Majid Ahmadi",
booktitle = "{Proceedings of the 38th Design Automation Conference}",
doi = "10.1145/378239.378496",
isbn = "1-58113-297-2",
pages = "313--316",
publisher = "{ACM}",
title = "{Fault Characterizations and Design-for-Testability Technique for Detecting IDDQ Faults in CMOS/BiCMOS Circuits}",
year = 2001,
}