Michael L. Behm, John M. Ludden, Yossi Lichtenstein, Michal Rimon, Michael Vinov
Industrial experience with test generation languages for processor verification
DAC, 2004.
@inproceedings{DAC-2004-BehmLLRV, author = "Michael L. Behm and John M. Ludden and Yossi Lichtenstein and Michal Rimon and Michael Vinov", booktitle = "{Proceedings of the 41st Design Automation Conference}", doi = "10.1145/996566.996578", isbn = "1-58113-828-8", pages = "36--40", publisher = "{ACM}", title = "{Industrial experience with test generation languages for processor verification}", year = 2004, }