Industrial experience with test generation languages for processor verification
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Michael L. Behm, John M. Ludden, Yossi Lichtenstein, Michal Rimon, Michael Vinov
Industrial experience with test generation languages for processor verification
DAC, 2004.

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@inproceedings{DAC-2004-BehmLLRV,
	author        = "Michael L. Behm and John M. Ludden and Yossi Lichtenstein and Michal Rimon and Michael Vinov",
	booktitle     = "{Proceedings of the 41st Design Automation Conference}",
	doi           = "10.1145/996566.996578",
	isbn          = "1-58113-828-8",
	pages         = "36--40",
	publisher     = "{ACM}",
	title         = "{Industrial experience with test generation languages for processor verification}",
	year          = 2004,
}

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