Travelled to:1 × USA
Collaborated with:J.M.Ludden Y.Lichtenstein M.Rimon M.Vinov
Talks about:processor (1) industri (1) languag (1) generat (1) experi (1) verif (1) test (1)
Person: Michael L. Behm
DBLP: Behm:Michael_L=
Contributed to:
2004Wrote 1 papers:
- DAC-2004-BehmLLRV #experience #generative #industrial #testing #verification
- Industrial experience with test generation languages for processor verification (MLB, JML, YL, MR, MV), pp. 36–40.