Novel sizing algorithm for yield improvement under process variation in nanometer technology
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Seung Hoon Choi, Bipul Chandra Paul, Kaushik Roy
Novel sizing algorithm for yield improvement under process variation in nanometer technology
DAC, 2004.

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@inproceedings{DAC-2004-ChoiPR,
	author        = "Seung Hoon Choi and Bipul Chandra Paul and Kaushik Roy",
	booktitle     = "{Proceedings of the 41st Design Automation Conference}",
	doi           = "10.1145/996566.996695",
	isbn          = "1-58113-828-8",
	pages         = "454--459",
	publisher     = "{ACM}",
	title         = "{Novel sizing algorithm for yield improvement under process variation in nanometer technology}",
	year          = 2004,
}

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