1 × USA
2 × Germany
K.Roy K.Kang S.H.Choi A.Raychowdhury S.Bhunia H.Kufluoglu M.A.Alam
technolog (2) improv (2) under (2) threshold (1) algorithm (1) ultralow (1) nanoscal (1) statist (1) reliabl (1) process (1)
Person: Bipul Chandra Paul
Wrote 4 papers:
- DATE-2006-PaulKKAR #design #estimation #performance #reliability
- Temporal performance degradation under NBTI: estimation and design for improved reliability of nanoscale circuits (BCP, KK, HK, MAA, KR), pp. 780–785.
- DATE-2006-RaychowdhuryPBR #case study #comparative #power management
- Ultralow power computing with sub-threshold leakage: a comparative study of bulk and SOI technologies (AR, BCP, SB, KR), pp. 856–861.
- DATE-2005-KangPR #analysis #statistics #using
- Statistical Timing Analysis using Levelized Covariance Propagation (KK, BCP, KR), pp. 764–769.
- DAC-2004-ChoiPR #algorithm #novel #process
- Novel sizing algorithm for yield improvement under process variation in nanometer technology (SHC, BCP, KR), pp. 454–459.