Chong Zhao, Xiaoliang Bai, Sujit Dey
A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits
DAC, 2004.
@inproceedings{DAC-2004-ZhaoBD,
author = "Chong Zhao and Xiaoliang Bai and Sujit Dey",
booktitle = "{Proceedings of the 41st Design Automation Conference}",
doi = "10.1145/996566.996804",
isbn = "1-58113-828-8",
pages = "894--899",
publisher = "{ACM}",
title = "{A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits}",
year = 2004,
}











