Chong Zhao, Xiaoliang Bai, Sujit Dey
A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits
DAC, 2004.
@inproceedings{DAC-2004-ZhaoBD, author = "Chong Zhao and Xiaoliang Bai and Sujit Dey", booktitle = "{Proceedings of the 41st Design Automation Conference}", doi = "10.1145/996566.996804", isbn = "1-58113-828-8", pages = "894--899", publisher = "{ACM}", title = "{A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits}", year = 2004, }