4 × USA
S.Dey C.Zhao C.Visweswariah P.N.Strenski L.Chen J.Rajski
test (3) interconnect (2) methodolog (2) crosstalk (2) circuit (2) chip (2) uncertainti (1) processor (1) compound (1) scalabl (1)
Person: Xiaoliang Bai
Wrote 4 papers:
- DAC-2004-ZhaoBD #analysis #scalability
- A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits (CZ, XB, SD), pp. 894–899.
- DAC-2002-BaiVS #optimisation
- Uncertainty-aware circuit optimization (XB, CV, PNS), pp. 58–63.
- DAC-2001-ChenBD #embedded #fault #testing #using
- Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores (LC, XB, SD), pp. 317–320.
- DAC-2000-BaiDR #self
- Self-test methodology for at-speed test of crosstalk in chip interconnects (XB, SD, JR), pp. 619–624.