Logic soft errors in sub-65nm technologies design and CAD challenges
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Subhasish Mitra, Tanay Karnik, Norbert Seifert, Ming Zhang
Logic soft errors in sub-65nm technologies design and CAD challenges
DAC, 2005.

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@inproceedings{DAC-2005-MitraKSZ,
	author        = "Subhasish Mitra and Tanay Karnik and Norbert Seifert and Ming Zhang",
	booktitle     = "{Proceedings of the 42nd Design Automation Conference}",
	doi           = "10.1145/1065579.1065585",
	isbn          = "1-59593-058-2",
	pages         = "2--4",
	publisher     = "{ACM}",
	title         = "{Logic soft errors in sub-65nm technologies design and CAD challenges}",
	year          = 2005,
}

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