Subhasish Mitra, Tanay Karnik, Norbert Seifert, Ming Zhang
Logic soft errors in sub-65nm technologies design and CAD challenges
DAC, 2005.
@inproceedings{DAC-2005-MitraKSZ,
author = "Subhasish Mitra and Tanay Karnik and Norbert Seifert and Ming Zhang",
booktitle = "{Proceedings of the 42nd Design Automation Conference}",
doi = "10.1145/1065579.1065585",
isbn = "1-59593-058-2",
pages = "2--4",
publisher = "{ACM}",
title = "{Logic soft errors in sub-65nm technologies design and CAD challenges}",
year = 2005,
}











