Subhasish Mitra, Tanay Karnik, Norbert Seifert, Ming Zhang
Logic soft errors in sub-65nm technologies design and CAD challenges
DAC, 2005.
@inproceedings{DAC-2005-MitraKSZ, author = "Subhasish Mitra and Tanay Karnik and Norbert Seifert and Ming Zhang", booktitle = "{Proceedings of the 42nd Design Automation Conference}", doi = "10.1145/1065579.1065585", isbn = "1-59593-058-2", pages = "2--4", publisher = "{ACM}", title = "{Logic soft errors in sub-65nm technologies design and CAD challenges}", year = 2005, }