Hari Ananthan, Kaushik Roy
A fully physical model for leakage distribution under process variations in Nanoscale double-gate CMOS
DAC, 2006.
@inproceedings{DAC-2006-AnanthanR,
author = "Hari Ananthan and Kaushik Roy",
booktitle = "{Proceedings of the 43rd Design Automation Conference}",
doi = "10.1145/1146909.1147020",
isbn = "1-59593-381-6",
pages = "413--418",
publisher = "{ACM}",
title = "{A fully physical model for leakage distribution under process variations in Nanoscale double-gate CMOS}",
year = 2006,
}