Jianfeng Luo, Subarna Sinha, Qing Su, Jamil Kawa, Charles Chiang
An IC manufacturing yield model considering intra-die variations
DAC, 2006.
@inproceedings{DAC-2006-LuoSSKC,
author = "Jianfeng Luo and Subarna Sinha and Qing Su and Jamil Kawa and Charles Chiang",
booktitle = "{Proceedings of the 43rd Design Automation Conference}",
doi = "10.1145/1146909.1147100",
isbn = "1-59593-381-6",
pages = "749--754",
publisher = "{ACM}",
title = "{An IC manufacturing yield model considering intra-die variations}",
year = 2006,
}