Khaled R. Heloue, Navid Azizi, Farid N. Najm
Modeling and Estimation of Full-Chip Leakage Current Considering Within-Die Correlation
DAC, 2007.
@inproceedings{DAC-2007-HeloueAN, author = "Khaled R. Heloue and Navid Azizi and Farid N. Najm", booktitle = "{Proceedings of the 44th Design Automation Conference}", doi = "10.1145/1278480.1278504", pages = "93--98", publisher = "{IEEE}", title = "{Modeling and Estimation of Full-Chip Leakage Current Considering Within-Die Correlation}", year = 2007, }