Tao Li, Zhiping Yu
Statistical Analysis of Full-Chip Leakage Power Considering Junction Tunneling Leakage
DAC, 2007.
@inproceedings{DAC-2007-LiY,
	author        = "Tao Li and Zhiping Yu",
	booktitle     = "{Proceedings of the 44th Design Automation Conference}",
	doi           = "10.1145/1278480.1278505",
	pages         = "99--102",
	publisher     = "{IEEE}",
	title         = "{Statistical Analysis of Full-Chip Leakage Power Considering Junction Tunneling Leakage}",
	year          = 2007,
}











