Tao Li, Zhiping Yu
Statistical Analysis of Full-Chip Leakage Power Considering Junction Tunneling Leakage
DAC, 2007.
@inproceedings{DAC-2007-LiY, author = "Tao Li and Zhiping Yu", booktitle = "{Proceedings of the 44th Design Automation Conference}", doi = "10.1145/1278480.1278505", pages = "99--102", publisher = "{IEEE}", title = "{Statistical Analysis of Full-Chip Leakage Power Considering Junction Tunneling Leakage}", year = 2007, }