Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Yuji Ohsumi, Kewal K. Saluja
Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing
DAC, 2007.
@inproceedings{DAC-2007-WenMSKOS,
author = "Xiaoqing Wen and Kohei Miyase and Tatsuya Suzuki and Seiji Kajihara and Yuji Ohsumi and Kewal K. Saluja",
booktitle = "{Proceedings of the 44th Design Automation Conference}",
doi = "10.1145/1278480.1278615",
pages = "527--532",
publisher = "{IEEE}",
title = "{Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing}",
year = 2007,
}